A Comparative Analysis of the Functional and the Structural Level Fault Detection for Sequential Machines

In this report a new concept to generate test vectors for sequential machines is checked. Not one level of abstraction is considered but two levels. The test generation occurs at the functional level, while information is retrieved from the structural level. Four methods for test generation, using structural level information at the functional level were used to check the concept. Test generation was done for a few examples. A comparison was made with a conventional functional level test generation algorithm and a conventional structural level test generation algorithm. The concept of using structural level information on functional level test generation gave for all the examples better results than the conventional test generation algorithms.